LP-1 High Frequency Response Logic Probe, DTL TTL CMOS Pulse Memory Logic Tester

The GLP-1A logic pulse is designed for in-circuit testing of TTL, CMOS, and various other logic devices at a maximum frequency of 50MHz. Additionally, the GLP-1A is equipped with a logic probe function featuring a minimum detectable pulse width of 10 ns, ensuring ample sensitivity for most applications.

Here’s how to use it:

1. Connect the RED clip to the + terminal and the BLACK clip to the – terminal of the power source in the circuit under test.

2. For TTL and DTL testing, set the upper select switch to the side marked “TIL”.

3. For CMOS testing, set the upper select switch to the side marked “CMOS” and make contact with the probe pin to the test point. The LEDs will indicate logic states:
– A) All LEDs OFF – High impedance
– B) RED LED ON – High State (1)
– C) Green LED ON – Low State (0)
– D) Orange LED ON – Pulse.

4. For detecting and storing pulses or level transitions, set the lower select switch to the side marked “PULSE” initially. Contact the probe pin to the test point, and the LEDs will indicate its basic state. Then, set the lower select switch to the side marked “MEM”. The orange LED will illuminate upon detecting any pulse or level transition. The direction of the pulse, in comparison with the original basic state, is determined by the cable.

5. After use, reset the logic probe by setting the lower select switch back to the side marked “PULSE”.

Package Includes:

1 x LP-1 DTL TTL CMOS Pulse Memory Logic Tester Probe.